Determination of interface trap capture cross sections using three-level charge pumping
نویسندگان
چکیده
منابع مشابه
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Dip. di Fisica Teorica, Univ. di Torino and INFN, Via P. Giuria 1, I10125 Turin, Italy, Dep. de F́ısica Moderna, Univ. de Granada, 18071 Granada, Spain, Dep. de F́ısica Atómica, Molecular y Nuclear, Univ. de Sevilla, Apdo. 1065, 41080 Sevilla, Spain, CTP, LNS and Dep. of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA, Dep. für Physik und Astronomie, Univ. Basel, CH-4056 ...
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ژورنال
عنوان ژورنال: IEEE Electron Device Letters
سال: 1990
ISSN: 0741-3106,1558-0563
DOI: 10.1109/55.57927